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MC74AC00_15 Datasheet, PDF (2/8 Pages) ON Semiconductor – Quad 2-Input NAND Gate
MC74AC00, MC74ACT00
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink/Source Current
DC Supply Current per Output Pin
DC Ground Current per Output Pin
Storage Temperature Range
Lead temperature, 1 mm from Case for 10 Seconds
Junction temperature under Bias
Thermal Resistance (Note 2)
(Note 1)
SOIC
TSSOP
*0.5 to )7.0
*0.5 v VI v VCC )0.5
*0.5 v VO v VCC )0.5
$20
$50
$50
$50
$50
*65 to )150
260
)150
125
170
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
PD
Power Dissipation in Still Air at 85°C
SOIC
125
mW
TSSOP
170
MSL
Moisture Sensitivity
Level 1
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 30% − 35%
UL 94 V−0 @ 0.125 in
Human Body Model (Note 3)
> 2000
V
Machine Model (Note 4)
> 200
Charged Device Model (Note 5)
> 1000
ILatch−Up Latch−Up Performance Above VCC and Below GND at 85°C (Note 6)
$100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
MC74AC00
2.0
5.0
6.0
V
MC74ACT00
4.5
5.0
5.5
Vin, Vout DC Input Voltage, Output Voltage (Ref. to GND)
0
−
VCC
V
tr, tf
Input Rise and Fall Time (Note 7)
MC74AC00
VCC @ 3.0 V
−
150
−
ns/V
VCC @ 4.5 V
−
40
−
VCC @ 5.5 V
−
25
−
tr, tf
Input Rise and Fall Time (Note 8)
MC74ACT00
VCC @ 4.5 V
−
10
−
ns/V
VCC @ 5.5 V
−
8.0
−
TJ
Junction Temperature
−
−
150
°C
TA
Operating Ambient Temperature Range
−55
25
125
°C
IOH
Output Current − High
−
−
−24
mA
IOL
Output Current − Low
−
−
24
mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
7. Vin from 30% to 70% VCC.
8. Vin from 0.8 V to 2.0 V.
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