MC10EL05_06 Datasheet, PDF (2/9 Pages) ON Semiconductor – 5V ECL 2-Input Differential AND/NAND

Table 1. TRUTH TABLE
D0
D1
D0
D1
L
L
H
H
L
H
H
L
H
L
L
H
H
H
L
L
MC10EL05, MC100EL05
Q
Q
L
H
L
H
L
H
H
L
Table 1. PIN DESCRIPTION
PIN
Function
D0, D0; D1, D1
ECL Data Inputs
Q, Q
ECL Data Outputs
V_CC
Positive Supply
V_EE
Negative Supply
EP
Exposed pad must be connected to a
sufficient thermal conduit. Electrically
connect to the most negative supply or
leave floating open.
Table 2. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
V_CC
PECL Mode Power Supply
V_EE
NECL Mode Power Supply
V_I
PECL Mode Input Voltage
NECL Mode Input Voltage
I_out
Output Current
V_EE = 0 V
V_CC = 0 V
V_EE = 0 V
V_CC = 0 V
Continuous
Surge
V_I  V_CC
V_I  V_EE
8
V
−8
V
6
V
−6
V
50
mA
100
mA
T_A
Operating Temperature Range
T_stg
Storage Temperature Range
q_JA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
SOIC−8
SOIC−8
−40 to +85
−65 to +150
190
130
°C
°C
°C/W
°C/W
q_JC
Thermal Resistance (Junction−to−Case)
Standard Board
q_JA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
SOIC−8
TSSOP−8
TSSOP−8
41 to 44
185
140
°C/W
°C/W
°C/W
q_JC
Thermal Resistance (Junction−to−Case)
Standard Board
q_JA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
TSSOP−8
DFN8
DFN8
41 to 44 ± 5%
129
84
°C/W
°C/W
°C/W
T_sol
Wave Solder
Pb <2 to 3 sec @ 248°C
Pb−Free <2 to 3 sec @ 260°C
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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