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MBR40H100WT_10 Datasheet, PDF (2/6 Pages) ON Semiconductor – SWITCHMODE™ Power Rectifier
MBR40H100WT
MAXIMUM RATINGS (Per Diode Leg)
Rating
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
Average Rectified Forward Current
TC = 148°C, per Diode
TC = 150°C, per Device
Peak Repetitive Forward Current
(Square Wave, 20 kHz) TC = 144°C
Nonrepetitive Peak Surge Current
(Surge applied at rated load conditions halfwave, single phase, 60 Hz)
Symbol
VRRM
VRWM
VR
IF(AV)
IFRM
IFSM
Value
100
20
40
40
200
Unit
V
A
A
A
Operating Junction Temperature (Note 1)
Storage Temperature
Voltage Rate of Change (Rated VR)
Controlled Avalanche Energy (see test conditions in Figures 10 and 11)
ESD Ratings: Machine Model = C
Human Body Model = 3B
TJ
Tstg
dv/dt
WAVAL
+175
°C
*65 to +175
°C
10,000
V/ms
400
mJ
> 400
V
> 8000
THERMAL CHARACTERISTICS
Maximum Thermal Resistance − Junction−to−Case
− Junction−to−Ambient (Socket Mounted)
RqJC
RqJA
0.58
°C/W
32
ELECTRICAL CHARACTERISTICS
Characterisitc
Symbol Min Typ Max Unit
Instantaneous Forward Voltage (Note 2)
(IF = 20 A, TJ = 25°C)
(IF = 20 A, TJ = 125°C)
(IF = 40 A, TJ = 25°C)
(IF = 40 A, TJ = 125°C)
vF
V
−
0.74 0.80
−
0.61 0.67
−
0.85 0.90
−
0.72 0.76
Instantaneous Reverse Current (Note 2)
(Rated dc Voltage, TJ = 125°C)
(Rated dc Voltage, TJ = 25°C)
iR
mA
−
2.0
10
− 0.0012 0.01
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The heat generated must be less than the thermal conductivity from Junction−to−Ambient: dPD/dTJ < 1/RqJA.
2. Pulse Test: Pulse Width = 300 ms, Duty Cycle ≤ 2.0%.
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