CS1124 Datasheet, PDF (2/8 Pages) ON Semiconductor – Dual Variable−Reluctance Sensor Interface IC

CS1124
MAXIMUM RATINGS
Rating
Value
Unit
Storage Temperature Range
−65 to 150
°C
Ambient Operating Temperature
−40 to 125
°C
Supply Voltage Range (continuous)
−0.3 to 7.0
V
Input Voltage Range (at any input, R1 = R2 = 22 k)
−250 to 250
V
Maximum Junction Temperature
150
°C
ESD Susceptibility (Human Body Model)
2.0
kV
Lead Temperature Soldering:
Reflow: (SMD styles only) (Note 1)
230 peak
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. 60 second maximum above 183°C.
ELECTRICAL CHARACTERISTICS (4.5 V < V_CC < 5.5 V, −40°C < T_A < 125°C, V_DIAG = 0; unless otherwise specified.)
Characteristic
Test Conditions
Min
Typ
Max
V_CC SUPPLY
Operating Current Supply
Sensor Inputs
V_CC = 5.0 V
−
−
5.0
Input Threshold − Positive
V_DIAG = Low
V_DIAG = High
135
160
185
135
160
185
Input Threshold − Negative
V_DIAG = Low
V_DIAG = High
−185
135
−160
160
−135
185
Input Bias Current (INP1, INP2)
Input Bias Current (DIAG)
Input Bias Current Factor (K_I)
(IN_Adj = INP × K_I)
V_IN = 0.336 V
V_DIAG = 0 V
V_IN = 0.336 V, V_DIAG = Low
V_IN = 0.336 V, V_DIAG = High
−16
−11
−6.0
−
−
1.0
−
100
−
152
155
157
Bias Current Matching
Input Clamp − Negative
INP1 or INP2 to IN_Adj, V_IN = 0.336 V
−1.0
0
1.0
I_IN = −50 mA
I_IN = −12 mA
−0.5
−0.25
0
−0.5
−0.30
0
Input Clamp − Positive
Output Low Voltage
Output High Voltage
Mode Change Time Delay
I_IN = +12 mA
I_OUT = 1.6 mA
I_OUT = −1.6 mA
−
5.0
7.0
9.0
−
0.2
0.4
V_CC − 0.5 V_CC − 0.2
−
0
−
20
Input to Output Delay
Output Rise Time
Output Fall Time
Open−Sensor Positive Threshold
Logic Inputs
I_OUT = 1.0 mA
C_LOAD = 30 pF
C_LOAD = 30 pF
V_DIAG = High, R_IN(Adj) = 40 k. Note 2
−
−
−
29.4
1.0
0.5
0.05
54
20
2.0
2.0
86.9
DIAG Input Low Threshold
−
−
−
0.2 × V_CC
DIAG Input High Threshold
−
0.7 × V_CC
−
−
DIAG Input Resistance
V_IN = 0.3 × V_CC , V_CC = 5.0 V
V_IN = V_CC, V_CC = 5.0 V
8.0
22
70
8.0
22
70
2. This parameter is guaranteed by design, but not parametrically tested in production.
Unit
mA
mV
mV
mV
mV
mA
mA
%INP
%INP
mA
V
V
V
V
V
ms
ms
ms
ms
kW
V
V
kW
kW
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