CAT93C86-C Datasheet, PDF (2/13 Pages) ON Semiconductor – 16K-Bit Microwire Serial EEPROM

CAT93C86 (Rev. C)
ABSOLUTE MAXIMUM RATINGS ⁽¹⁾
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground⁽²⁾
V_CC with Respect to Ground
Package Power Dissipation Capability (T_A = 25ºC)
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current⁽³⁾
Ratings
–55 to +125
–65 to 150
-2.0 to +V_CC +2.0
-2.0 to +7.0
1.0
300
100
Units
ºC
ºC
V
V
W
ºC
mA
RELIABILITY CHARACTERISTICS
Symbol
N_END(4)
T_DR(4)
V_ZAP(4)
I_LTH(4)(5)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
D.C. OPERATING CHARACTERISTICS
V_CC = +1.8 V to +5.5 V unless otherwise specified.
Symbol
Parameter
Test Conditions
I_CC1
I_CC2
I_SB1
I_SB2
I_LI
I_LO
V_IL1
V_IH1
V_IL2
V_IH2
V_OL1
V_OH1
V_OL2
V_OH2
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
f_SK = 1 MHz; V_CC = 5.0 V
f_SK = 1 MHz; V_CC = 5.0 V
CS = 0 V ORG = GND
CS = 0 V ORG = Float or V_CC
V_IN = 0 V to V_CC
V_OUT = 0 V to V_CC, CS = 0 V
4.5 V ≤ V_CC < 5.5 V
4.5 V ≤ V_CC < 5.5 V
1.8 V ≤ V_CC < 4.5 V
1.8 V ≤ V_CC < 4.5 V
4.5 V ≤ V_CC < 5.5 V; I_OL = 2.1 mA
4.5 V ≤ V_CC < 5.5 V; I_OH = -400 µA
1.8 V ≤ V_CC < 4.5 V; I_OL = 1 mA
1.8 V ≤ V_CC < 4.5 V; I_OH = -100 µA
Min
1,000,000
100
2000
100
Min Typ
0
-0.1
2
0
V_CC x 0.7
2.4
V_CC - 0.2
Units
Cycles/Byte
Years
V
mA
Max
3
500
10
Units
mA
µA
µA
10
µA
1
µA
1
µA
0.8
V
V_CC + 1
V
V_CC x 0.2
V
V_CC + 1
V
0.4
V
V
0.2
V
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5 V, which may overshoot to V_CC +2.0 V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) These parameters are tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1 V to V_CC +1 V.
Doc. No. MD-1091 Rev. S
2
© 2009 SCILLC. All rights reserved
Characteristics subject to change without notice