CAT93C76B Datasheet, PDF (2/13 Pages) ON Semiconductor – 8-Kb Microwire Serial EEPROM

CAT93C76B
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Temperature Under Bias
Storage Temperature
−55 to +125
°C
−65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
V_CC with Respect to Ground
Lead Soldering Temperature (10 seconds)
−2.0 to +V_CC +2.0
V
−2.0 to +7.0
V
300
°C
Output Short Circuit Current (Note 2)
100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The minimum DC input voltage is −0.5 V. During transitions, inputs may undershoot to −2.0 V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5 V, which may overshoot to V_CC +2.0 V for periods of less than 20 ns.
2. Output shorted for no more than one second.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Reference Test Method
Min
Units
N_END (Note 3)
Endurance
MIL−STD−883, Test Method 1033
1,000,000
T_DR (Note 3)
Data Retention
MIL−STD−883, Test Method 1008
100
V_ZAP (Note 3)
ESD Susceptibility
MIL−STD−883, Test Method 3015
2,000
I_LTH (Notes 3, 4)
Latch−Up
JEDEC Standard 17
100
3. These parameters are tested initially and after a design or process change that affects the parameter.
4. Latch−up protection is provided for stresses up to 100 mA on I/O pins from −1 V to V_CC + 1 V.
Cycles / Byte
Years
V
mA
Table 3. D.C. OPERATING CHARACTERISTICS
(V_CC = +1.8 V to +5.5 V, T_A = −40°C to +125°C, V_CC = +1.65 V to +5.5 V, T_A = −20°C to +85°C unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
Units
I_CC1
I_CC2
I_SB1
I_SB2
I_LI
I_LO
V_IL1
V_IH1
V_IL2
V_IH2
V_OL1
V_OH1
V_OL2
V_OH2
Supply Current (Write)
Supply Current (Read)
Standby Current
(x8 Mode)
Standby Current
(x16 Mode)
Input Leakage Current
Output Leakage
Current
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Write, V_CC = 5.0 V
Read, DO open, f_SK = 2 MHz, V_CC = 5.0 V
V_IN = GND or V_CC
CS = GND, ORG = GND
T_A = −40°C to +85°C
T_A = −40°C to +125°C
V_IN = GND or V_CC
CS = GND,
ORG = Float or V_CC
T_A = −40°C to +85°C
T_A = −40°C to +125°C
V_IN = GND to V_CC
T_A = −40°C to +85°C
T_A = −40°C to +125°C
V_OUT = GND to V_CC
CS = GND
T_A = −40°C to +85°C
T_A = −40°C to +125°C
4.5 V ≤ V_CC < 5.5 V
4.5 V ≤ V_CC < 5.5 V
1.65 V ≤ V_CC < 4.5 V
1.65 V ≤ V_CC < 4.5 V
4.5 V ≤ V_CC < 5.5 V, I_OL = 3 mA
4.5 V ≤ V_CC < 5.5 V, I_OH = −400 mA
1.65 V ≤ V_CC < 4.5 V, I_OL = 1 mA
1.65 V ≤ V_CC < 4.5 V, I_OH = −100 mA
2
mA
500
mA
2
mA
5
1
mA
3
1
mA
2
1
mA
2
−0.1
0.8
V
2
V_CC + 1
V
0
V_CC x 0.2
V
V_CC x 0.7
V_CC + 1
V
0.4
V
2.4
V
0.2
V
V_CC − 0.2
V
Table 4. PIN CAPACITANCE (Note 3)
Symbol
Test
C_OUT
C_IN
Output Capacitance (DO)
Input Capacitance (CS, SK, DI, ORG)
Conditions
Min
V_OUT = 0 V
V_IN = 0 V
Typ
Max
Units
5
pF
5
pF
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