BFL4004 Datasheet, PDF (2/7 Pages) Sanyo Semicon Device – N-Channel Silicon MOSFET General-Purpose Switching Device Applications

BFL4004
Electrical Characteristics at Ta=25°C
Parameter
Drain-to-Source Breakdown Voltage
Zero-Gate Voltage Drain Current
Gate-to-Source Leakage Current
Cutoff Voltage
Forward Transfer Admittance
Static Drain-to-Source On-State Resistance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-ON Delay Time
Rise Time
Turn-OFF Delay Time
Fall Time
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain “Miller” Charge
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Symbol
V(BR)DSS
IDSS
IGSS
VGS(off)
| yfs |
RDS(on)
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
VSD
trr
Qrr
Conditions
ID=10mA, VGS=0V
VDS=640V, VGS=0V
VGS=±30V, VDS=0V
VDS=10V, ID=1mA
VDS=20V, ID=3.25A
ID=3.25A, VGS=10V
VDS=30V, f=1MHz
See Fig.2
VDS=200V, VGS=10V, ID=6.5A
IS=6.5A, VGS=0V
See Fig.3
IS=6.5A, VGS=0V, di/dt=100A/μs
Ratings
Unit
min
typ
max
800
V
1.0 mA
±100 nA
2.0
4.0
V
1.7
3.4
S
1.9
2.5
Ω
710
pF
120
pF
42
pF
17
ns
44
ns
130
ns
44
ns
36
nC
6.2
nC
18
nC
0.85
1.2
V
970
ns
6700
nC
Fig.1 Unclamped Inductive Switching Test Circuit
D
L
≥50Ω
RG _G
S
10V
0V
50Ω
VDD
BFL4004
Fig.2 Switching Time Test Circuit
VIN
10V
0V
VIN
PW≤10μs
D.C.≤1%
VDD=200V
ID=3.25A
RL=59Ω
D
VOUT
G
S _BFL4004
P.G
50Ω
Fig.3 Reverse Recovery Time Test Circuit
D
BFL4004
G
S
500μH
VDD=50V
Driver MOSFET
Ordering Information
Device
BFL4004-1E
Package
TO-220F-3FS
Shipping
50pcs./tube
memo
Pb Free
No. A1796-2/7