KAI-02170 Datasheet, PDF (19/50 Pages) ON Semiconductor – Interline CCD Image Sensor

KAI−02170
ǒ Ǔ ^{Max. Signal * Min. Signal}
Global Uniformity + 100 @
Active Area Signal
Units : % pp
Center Non-Uniformity
This test is performed with the imager illuminated to
a level such that the output is at 70% of saturation
(approximately 924 mV). Prior to this test being performed
the substrate voltage has been set such that the charge
capacity of the sensor is 1,320 mV. Defects are excluded for
the calculation of this test. This test is performed on the
center 100 by 100 pixels of the sensor. Center uniformity is
defined as:
ǒ Ǔ ^{Center ROI Standard Deviation}
Center ROI Uniformity + 100 @
Center ROI Signal
Units : % rms
Center ROI Signal = Center ROI Average − Dark Colum Average
Dark Field Defect Test
This test is performed under dark field conditions.
The sensor is partitioned into 256 sub regions of interest,
each of which is 120 by 120 pixels in size. In each region of
interest, the median value of all pixels is found. For each
region of interest, a pixel is marked defective if it is greater
than or equal to the median value of that region of interest
plus the defect threshold specified in the “Defect
Definitions” section.
Bright Field Defect Test
This test is performed with the imager illuminated to
a level such that the output is at approximately 924 mV.
Prior to this test being performed the substrate voltage has
been set such that the charge capacity of the sensor is
1,320 mV. The average signal level of all active pixels is
found. The bright and dark thresholds are set as:
Dark Defect Threshold = Active Area Signal @ Threshold
Bright Defect Threshold = Active Area Signal @ Threshold
The sensor is then partitioned into 144 sub regions of
interest, each of which is 120 by 120 pixels in size. In each
region of interest, the average value of all pixels is found.
For each region of interest, a pixel is marked defective if it
is greater than or equal to the median value of that region of
interest plus the bright threshold specified or if it is less than
or equal to the median value of that region of interest minus
the dark threshold specified.
Example for Major Bright Field Defective Pixels:
• Average value of all active pixels is found to be 924 mV.
• Dark defect threshold: 924 mV ⋅ 12 % = 111 mV.
• Bright defect threshold: 924 mV ⋅ 12 % = 111 mV.
• Region of interest #1 selected. This region of interest is
pixels 9, 9 to pixels 128, 128.
♦ Median of this region of interest is found to be
920 mV.
♦ Any pixel in this region of interest that is
≤ (920 − 111 mV) 809 mV in intensity will be
marked defective.
♦ Any pixel in this region of interest that is
≥ (920 + 111 mV) 1,031 mV in intensity will be
marked defective.
• All remaining 144 sub regions of interest are analyzed
for defective pixels in the same manner.
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