TND307 Datasheet, PDF (1/8 Pages) ON Semiconductor – Graphical Data Test Circuits for the NCP1650

TND307
Graphical Data Test
Circuits for the NCP1650
Prepared by
Alan Ball
ON Semiconductor Applications Engineering
The following circuits are the test configurations that
were used to obtain the data for the graphical section of the
NCP1650/D data sheet. Each graph has a schematic
associated with it and in some cases a description of the
procedure.
http://onsemi.com
APPLICATION NOTE
30 k
0.5 mF
0–5 V
0.1 mF
47 k
1
3
V_in
AC Comp
4 _{Ref Filter}
5 _{AC Input}
6 _FB/SD
7 _{Loop Comp}
8 _Pcomp
9 _Pmax
2 ^{0.1 mF}
V_ref
14 V
1 mF
Output ¹⁶
I_S– ¹²
300
0 to –5 V
I_avg
10
11
I_{avg fltr}
1 nF
Ramp
GND
15
C_T Comp
14 13
15 k
10
10 k _{470 pF}
47 k
Figure 1. Power Multiplier Family of Curves
Re: NCP1650/D data sheet, Figure 3
Power up chip. Set I_S– between 0 and –200 mV in 50 mV
increments. For each value of I_S– set the ac input (pin 5) to
various values from 0 to 3.8 volts. Record output P_max (pin 9).
30 k
0.05 mF
0–5 V
0–5 V
1k
1
2 ^{0.1 mF}
3
V_in
AC Comp
4 _{Ref Filter}
5 _{AC Input}
6 _FB/SD
7 _{Loop Comp}
8 _Pcomp
9 _Pmax
V_ref
Output ¹⁶
I_S– ¹²
I_avg
10
11
I_{avg fltr}
Ramp
GND
C_T Comp
15
14 13
10 k _{470 pF}
47 k
14 V
1 mF
Figure 2. Reference Multiplier Family of Curves
Re: NCP1650/D data sheet, Figure 4
© Semiconductor Components Industries, LLC, 2002
1
March, 2002 – Rev.0
Publication Order Number:
TND307/D