NBSG86A Datasheet, PDF (1/20 Pages) ON Semiconductor – Evaluation Board Manual

NBSG86ABAEVB
Evaluation Board Manual
for NBSG86A
DESCRIPTION
This document describes the NBSG86A evaluation board
and the appropriate lab test setups. It should be used in
conjunction with the device data sheet, which includes
specifications and a full description of device operation.
The board is used to evaluate the NBSG86A
GigaComm™ differential Smart Gate multi-function logic
gate, which can be configured as an AND/NAND,
OR/NOR, XOR/XNOR, or 2:1 MUX. The OLS input of the
NBSG86A is used to program the peak–to–peak output
amplitude between 0 and 800 mV in five discrete steps.
The board is implemented in two layers and provides a
high bandwidth 50 W controlled impedance environment for
higher performance. The first layer or primary trace layer is
5 mils thick Rogers RO6002 material, which is engineered
to have equal electrical length on all signal traces from the
NBSG86A device to the sense output. The second layer is
32 mils thick copper ground plane.
For standard lab setup and test, a split (dual) power supply
is required enabling the 50 W impedance from the scope to
be used as termination of the ECL signals, where V_TT is the
system ground (V_CC = 2.0 V, V_TT = V_CC - 2.0 V and V_EE
is -0.5 V or -1.3 V, see Setup 1).
http://onsemi.com
EVALUATION BOARD MANUAL
What measurements can you expect to make?
The following measurements can be performed in the
single–ended (Note 1) or differential mode of operation:
• Frequency Performance
• Output Amplitude (V_OH /V_OL)
• Output Rise and Fall Time
• Output Skew
• Eye pattern generation
• Jitter
• V_IHCMR (Input High Common Mode Range)
NOTE:
1. Single- ended meas urements can only be made at
V_CC - V_EE = 3.3 V using this board setup.
Figure 1. NBSG86A Evaluation Board
© Semiconductor Components Industries, LLC, 2003
1
March, 2003 - Rev. 0
Publication Order Number:
NBSG86ABAEVB/D