NBSG111BAEVB Datasheet, PDF (1/12 Pages) ON Semiconductor – Evaluation Board Manual for NBSG111

NBSG111BAEVB
Evaluation Board Manual
for NBSG111
http://onsemi.com
EVALUATION BOARD MANUAL
DESCRIPTION
This document describes the NBSG111 evaluation board
and the appropriate lab test setups. It should be used in
conjunction with the NBSG111 data sheet which contains
full technical details on the device specifications and
operation.
The evaluation board is designed to facilitate a quick
evaluation of the NBSG111 GigaComm™ 1:10 clock data
driver. The NBSG111 allows selection between two inputs
and fan out 10 identical differential outputs. The Reduced
Swing ECL (RSECL) output ensures minimal noise and fast
switching edges.
The evaluation board is implemented in two layers for
higher performance. For standard lab setup and test, a split
(dual) power supply is required enabling the 50 W
impedance from the scope to be used as termination of the
ECL signals (V_TT = V_CC – 2.0 V, in split power supply setup,
V_TT is the system ground).
What measurements can you expect to make?
With this evaluation board, the following measurements
could be performed in single−ended⁽¹⁾ or differential modes
of operation:
• Jitter
• Output Skew
• Gain/Return Loss
• Eye Pattern Generation
• Frequency Performance
• Output Rise and Fall Time
• V_IHCMR (Input High Common Mode Range)
1. Single−ended measurements can only be made at
V_CC − V_EE = 3.3 V using this board setup.
Figure 1. NBSG111 Evaluation Board
© Semiconductor Components Industries, LLC, 2003
1
October, 2003 − Rev. 0
Publication Order Number:
NBSG111BAEVB/D