NB4N527SMNEVB Datasheet, PDF (1/8 Pages) ON Semiconductor – Evaluation Board Manual for NB4N527S

NB4N527SMNEVB
Evaluation Board Manual
for NB4N527S
INTRODUCTION
ON Semiconductor has developed an evaluation board for
the NB4N527S device as a convenience for the customers
interested in performing their own device engineering
assessment. This board provides a high bandwidth 50 W
controlled impedance environment. The pictures in Figure 1
show the top and bottom view of the evaluation board, which
can be configured in several different ways.
This evaluation board manual contains:
• Information on 16−lead QFN Evaluation Board
• Assembly Instructions
• Appropriate Lab Setup
• Bill of Materials
This manual should be used in conjunction with the
NB4N527S device data sheet, which contains full technical
details on the device specifications and operation.
http://onsemi.com
EVALUATION BOARD MANUAL
Board Lay−Up
The 16−lead QFN evaluation board is implemented in
four layers with split (dual) power supplies (Figure 2,
Evaluation Board Lay−up). For standard lab setup, a split
(dual) power supply is essential to enable the 50 W internal
impedance in the oscilloscope as a device termination. The
first layer or primary trace layer is 0.005, thick Rogers
RO6002 material, which is designed to have equal electrical
length on all signal traces from the device under the test
(DUT) to the sense output. The second layer is the 1.0 oz.
copper ground plane. The FR4 dielectric material is placed
between the second and third layer, and between the third
and fourth layer. The third layer is also a 1.0 oz copper
ground plane. The fourth layer is the secondary trace layer.
Top View
Bottom View
Figure 1. Top and Bottom View of the 16 QFN Evaluation Board
© Semiconductor Components Industries, LLC, 2008
1
September, 2008 − Rev. 1
Publication Order Number:
NB4N527SMNEVB/D