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NB3N51054 Datasheet, PDF (1/15 Pages) ON Semiconductor – LVDS PCIe Clock Generator | |||
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NB3N51054
3.3 V, Crystal to 100 MHz
Quad HCSL/LVDS PCIe
Clock Generator
The NB3N51054 is a precision, low phase noise clock generator that
supports PCI Express requirements. The device accepts a 25 MHz
fundamental mode parallel resonant crystal or a 25 MHz reference
clock signal and generates four differential HCSL/LVDS outputs (See
Figure 7 for LVDS interface) at 100 MHz clock frequency with
maximum skew of 40 ps. Through I2C interface, NB3N51054
provides selectable spread spectrum options of â0.35% and â0.5% for
applications demanding low Electromagnetic Interface (EMI) as well
as optimum performance with no spread option. The I2C interface
further enables control of each output and they can be enabled/
disabled individually.
www.onsemi.com
MARKING
DIAGRAM
TSSOPâ24
CASE 948H
NB3N5
1054G
ALYW
Features
⢠Uses 25 MHz Fundamental Crystal or Reference Clock Input
⢠Four Low Skew HCSL or LVDS Outputs
⢠I2C Support with Read Back Capability
⢠Spread of â0.35%, â0.5% and No Spread
⢠Individual Output Enable/Disable Control through I2C
⢠PCIe Gen 1, Gen 2, Gen 3 Compliant
⢠Typical Phase Jitter @ 100 MHz (Integrated 12 kHz to 20 MHz):
0.5 ps
⢠Typical CycleâCycle Jitter @ 100 MHz (10k cycles): 20 ps
⢠Phase Noise @ 100 MHz:
Offset Noise Power
100 Hz â104 dBc/Hz
1 kHz â121 dBc/Hz
10 kHz â131 dBc/Hz
100 kHz â136 dBc/Hz
1 MHz â140 dBc/Hz
10 MHz â155 dBc/Hz
⢠Operating Power Supply: 3.3 V ± 5%
⢠Industrial Temperature Range: â40°C to 85°C
⢠Functionally Compatible with ICS841S104I with enhanced
performance
⢠These are PbâFree Devices
A
= Assembly Location
L
= Wafer Lot
Y
= Year
W
= Work Week
G
= PbâFree Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 14 of this data sheet.
Application
⢠Networking
⢠Consumer
⢠Computing and Peripherals
⢠Industrial Equipment
⢠PCIe Clock Generation Gen 1, Gen 2 and Gen 3
End Products
⢠Switch and Router
⢠Set Top Box, LCD TV
⢠Servers, Desktop Computers
⢠Automated Test Equipment
© Semiconductor Components Industries, LLC, 2015
1
May, 2015 â Rev. 2
Publication Order Number:
NB3N51054/D
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