MC14094BDTR2G Datasheet, PDF (1/10 Pages) ON Semiconductor – 8-Stage Shift/Store Register with Three-State Outputs

MC14094B
8-Stage Shift/Store Register
with Three-State Outputs
The MC14094B combines an 8−stage shift register with a data latch
for each stage and a 3−state output from each latch.
Data is shifted on the positive clock transition and is shifted from the
seventh stage to two serial outputs. The Q_S output data is for use in
high−speed cascaded systems. The Q_S output data is shifted on the
following negative clock transition for use in low−speed cascaded systems.
Data from each stage of the shift register is latched on the negative
transition of the strobe input. Data propagates through the latch while
strobe is high.
Outputs of the eight data latches are controlled by 3−state buffers which
are placed in the high−impedance state by a logic Low on Output Enable.
Features
• 3−State Outputs
• Capable of Driving Two Low−Power TTL Loads or One Low−Power
Schottky TTL Load Over the Rated Temperature Range
• Input Diode Protection
• Data Latch
• Dual Outputs for Data Out on Both Positive and
Negative Clock Transitions
• Useful for Serial−to−Parallel Data Conversion
• Pin−for−Pin Compatible with CD4094B
• These Devices are Pb−Free and are RoHS Compliant
• NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
MAXIMUM RATINGS (Voltages Referenced to V_SS)
http://onsemi.com
MARKING DIAGRAMS
PDIP−16 ¹⁶
P SUFFIX
CASE 648
1
MC14094BCP
AWLYYWWG
SOIC−16
D SUFFIX
CASE 751B
16
14094BG
AWLYWW
TSSOP−16
DT SUFFIX
CASE 948F
1
16
14
094B
ALYWG
G
1
16
SOEIAJ−16
F SUFFIX
CASE 966
MC14094B
ALYWG
A
WL, L
YY, Y
WW, W
G or G
1
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Indicator
Symbol
Parameter
Value
Unit
V_DD
V_in, V_out
DC Supply Voltage Range
Input or Output Voltage Range
(DC or Transient)
−0.5 to +18.0
V
−0.5 to V_DD + 0.5
V
I_in, I_out
Input or Output Current
(DC or Transient) per Pin
±10
mA
P_D
Power Dissipation, per Package (Note 1)
T_A
Ambient Temperature Range
T_stg
Storage Temperature Range
T_L
Lead Temperature
(8−Second Soldering)
500
mW
−55 to +125
°C
−65 to +150
°C
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Temperature Derating: Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be
taken to avoid applications of any voltage higher than maximum rated voltages to this high−impedance circuit. For proper operation, V_in and V_out
should be constrained to the range V_SS v (V_in or V_out) v V_DD.
Unused inputs must always be tied to an appropriate logic voltage level
ORDERING INFORMATION
(e.g., either V_SS or V_DD). Unused outputs must be left open.
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2013
1
May, 2013 − Rev. 9
Publication Order Number:
MC14094B/D