LV8827LFQA Datasheet, PDF (1/13 Pages) ON Semiconductor – For Brushless Motor Drive PWM Driver IC

Ordering number : ENA2058
LV8827LFQA
Bi-CMOS IC
For Brushless Motor Drive
PWM Driver IC
http://onsemi.com
Overview
The LV8827LFQA is a PWM-type driver IC designed for 3-phase brushless motors. The rotational speed can be
controlled by inputting the PWM pulse from the outside, and changing Duty. The IC incorporates a latch-type
constraint protection circuit.
Features
• IO max = 1.5A (built-in output Tr)
• Speed control and synchronous rectification using direct PWM input (supports 3.3V inputs)
• 1-Hall FG output
• Latch type constraint protection circuit (the latch is released by S/S and F/R.)
• Forward/reverse switching circuit, Hall bias pin
• Power save circuit (Power save in stop mode)
• Current limiter circuit, Low-voltage protection circuit, Overheat protection circuit
• Charge pump circuit, 5V regulator output.
• Start/stop circuit (short brake when motor is to be stopped)
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
Output current
Allowable power dissipation
VCC max
VG max
IO max
Pd max2
VCC pin
VG pin
t ≤ 500ms *1
Mounted on a circuit board.*2
36 V
42 V
1.5 A
1.35 W
Junction temperature
Tj max
150 °C
Operating temperature
Topr
-40 to +80 °C
Storage temperature
Tstg
-55 to +150 °C
*1 : Tj cannot exceed Tj max = 150°C
*2 : Specified circuit board : 40mm × 50mm × 0.8mm, glass epoxy (four-layer board)
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
53012 SY 20120507-S00003 No.A2058-1/13