LV8824QA Datasheet, PDF (1/13 Pages) ON Semiconductor – PWM Driver IC

Ordering number : ENA2083
LV8824QA
Bi-CMOS IC
For Brushless Motor Drive
PWM Driver IC
http://onsemi.com
Overview
The LV8824QA is a PWM pre-driver IC suitable for use in 3-phase brushless motors. This IC was designed based on
the assumption that Nch FETs are used as the upper and lower output transistors. The rotational speed is controllable by
inputting PWM pulse or DC voltage externally and changing duty. LV8824QA incorporates latch-type constraint
protection circuit.
Features
• IO max = 50mA
• Speed control and synchronous rectification by PWM direct input (3.3V input-ready) and DC voltage.
• 3-Hall FG output
• Latch type constraint protection circuit (latch is released by S/B and F/R.)
• Forward/reverse switch circuit, Hall bias pin
• Power saving circuit
• Current limiter circuit, Low-voltage protection circuit, Thermal shut-down circuit
• Charge pump circuit (external Nch/Nch), 5V regulator output.
• Start/Brake circuit
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
Output current
Allowable power dissipation
VCC max
VG max
IO max
Pd max
VCC pin
VG pin
Mounted on a circuit board.*1
34 V
42 V
50 mA
1.45 W
Junction temperature
Tj max
150 °C
Operating temperature
Topr
-40 to +105 °C
Storage temperature
Tstg
-55 to +150 °C
*1 : Specified circuit board : 100mm × 100mm × 1.6mm, glass epoxy (double-layer board)
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
70412 SY 20120626-S00007 No.A2083-1/13