LV8548MC-AH Datasheet, PDF (1/6 Pages) ON Semiconductor – 12V Low Saturation Voltage Drive Forward/Reverse Motor Driver

Ordering number : ENA2038B
LV8548MC
Bi-CMOS integrated circuit
12V Low Saturation Voltage Drive
Forward/Reverse Motor Driver
http://onsemi.com
Overview
The LV8548MC is a 2-channel low saturation voltage forward/reverse motor driver IC. It is optimal for motor drive in
12V system products and can drive either two DC motors, one DC motor using parallel connection, or it can drive a
stepping motor in Full-step and Half-step.
Functions
• DMOS output transistor adoption (Upper and lower total RON=1Ω typ)
• For one power supply (The control system power supply is unnecessary.)
• Our motor driver IC, LB1948MC, and compatible pin
• It is possible to connect it in parallel (parallel, connected operation of
drive ch).
• The compact package (SOIC10) is adopted.
• VCC max=20V, IO max=1A
• Current consumption 0 when standing by
• Built-in brake function
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Maximum power supply voltage
Output impression voltage
VCC max
VOUT
-0.3 to +20
V
-0.3 to +20
V
Input impression voltage
GND pin outflow current
VIN
IGND
For ch
-0.3 to +6
V
1.0
A
Allowable Power dissipation
Pd max
*
1.0
W
Operating temperature
Topr
-30 to +85
°C
Storage temperature
Tstg
-40 to +150
°C
*: When mounted on the specified printed circuit board (57.0mm ×57.0mm × 1.6mm), glass epoxy, both sides
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
June, 2013
41812 SY/32812 SY 20120323-S00007/31512 SY No.A2038-1/6