LV8112V Datasheet, PDF (1/13 Pages) Sanyo Semicon Device – Bi-CMOS IC For Polygon Mirror Motor 3-phase Brushless Motor Driver

Ordering number : ENA1645B
LV8112V
Bi-CMOS IC
For Polygon Mirror Motor
3-phase Brushless Motor Driver
http://onsemi.com
Overview
The LV8112V is a 3-phase brushless motor driver for polygon mirror motor driving of LBP.
A circuit needed to drive of polygon mirror motor can be composed of a single-chip. Also, the output transistor is made
DMOS by using BiDC process, and by adopting the synchronous rectification method, the lower power consumption
(Heat generation) is achieved.
Features
• 3-phase bipolar drive
• Full complement of on-chip protection circuits, including lock
• Direct PWM drive + synchronous rectification
protection, current limiter, under-voltage protection, and thermal
• IO max1 = 2.5A
• IO max1 = 3.0A (t ≤ 0.1ms)
shutdown protection circuits
• Circuit to switch slowing down method while stopped
• Output current control circuit
(Free run or Short-circuit brake)
• PLL speed control circuit
• Constraint protection detection signal switching circuit (FG or LD)
• Phase lock detection output (with mask function) • Forward / Reverse switching circuit
• Compatible with Hall FG
• Hall bias pin (Bias current cut in a stopped state)
• Provides a 5V regulator output
• SDCC (Speed Detection Current Control) function
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
VCC max
VG max
VCC pin
VG pin
37
V
42
V
Output current
Allowable Power dissipation
IO max1
IO max2
Pd max
*1
t ≤ 0.1ms *1
Mounted on a specified board *2
2.5
A
3.0
A
1.7
W
Operation temperature
Topr
-25 to +80
°C
Storage temperature
Tstg
-55 to +150
°C
Junction temperature
Tj max
150
°C
*1. Tj max = 150°C must not be exceeded.
*2. Specified board: 114.3mm × 76.1mm × 1.6mm, glass epoxy board.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
31412 SY 20120224-S00005 / 30310 SY / 11310 SY 20091224-S00004 No.A1645-1/13