LV5044V Datasheet, PDF (1/7 Pages) Sanyo Semicon Device – Bi-CMOS IC 2ch step-down circuit DC-DC Converter Controller

Ordering number : ENA0534
LV5044V
Bi-CMOS IC
2ch step-down circuit
DC-DC Converter Controller
http://onsemi.com
Overview
The LV5044V is a high efficiency, 2-channel, step-down, DC-DC converter controller IC adopting a synchronous
rectifying system. Incorporating numerous functions on a single chip with easy external setting, it can be used for a
wide variety of applications. The device is optimal for use in multi-output power supply systems which are used in
LCD-TVs, DVD recorders, game machines, high-end office products, etc.
Features
• Provides dual step-down DC-DC converter controller circuits integrated on the same chip.
• Provides an input UVLO circuit, an overcurrent detection function, an overtemperature detection function, soft
start/soft stop functions, and a startup delay circuit.
• Output voltage monitoring functions (power good as well as OVP and UVP with timer latch functions)
• 180° interleaved operation between phase 1 and phase 2 (supports multiphase drive in 2-phase parallel operation
mode).
• Supports synchronous operation between different devices (supports master/slave operation when multiple devices
are used).
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
Peak output current
Allowable power dissipation
VIN
IOUT
Pd max
*1
18
V
±1.0
A
1
W
Operating temperature
Topr
-20 to +85
°C
Storage temperature
Tstg
-55 to +150
°C
Allowable pin voltage *2
1 HDRV1,2
18
V
CBOOT1,2
2 HDRV1,2 ,CBOOT1,2
6.5
V
to SW
3 VIN,
ILIM1,2
18
V
RSNS1,2, SW1,2
PGOOD1,2
4 VLIN5
6.5
V
VDD, LDRV1,2
5 COMP1,2, FB1,2
VLIN5+0.3
V
SS1,2, UV_DELAY
TD1,2, CT
CLKO
*1 Board size: 114.3×76.1×1.6mm³, glass epoxy board.
*2 Allowable pin voltages are referenced to the SGND and PGND pins, excluding No.2. No.2 Voltages are referenced to the SW pin.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
August, 2013
N2806 MS PC 20060927-S00009 No.A0534-1/7