LB8111V Datasheet, PDF (1/15 Pages) Sanyo Semicon Device – 8mm VTR Sensor Amplifier

Ordering number : ENA1416D
LV8111V
Bi-CMOS LSI
3-phase Brushless Motor Driver
for Polygon Mirror Motor
http://onsemi.com
Overview
The LV8111V is a 3-phase brushless motor driver for polygon mirror
motor driving of LBP.
A circuit needed to drive of polygon mirror motor can be composed of
a single-chip. Also, the output transistor is made DMOS by using
BiDC process, and by adopting the synchronous rectification method,
the lower power consumption (Heat generation) is achieved.
SSOP44K(275mil) Exposed Pad
Features
 3-phase bipolar drive
 Full complement of on-chip protection circuits, including lock
 Direct PWM drive + synchronous rectification protection, current limiter, under-voltage protection, and thermal
 IO max1 = 2.5A
 IO max1 = 3.0A (t  0.1ms)
 Output current control circuit
shutdown protection circuits
 Circuit to switch slowing down method while stopped
(Free run or Short-circuit brake)
 PLL speed control circuit
 Constraint protection detection signal switching circuit (FG or LD)
 Phase lock detection output
 Forward / Reverse switching circuit
(with mask function)
 Hall bias pin (Bias current cut in a stopped state)
 Compatible with Hall FG
 SDCC (Speed Detection Current Control) function
 Provides a 5V regulator output
Specifications
Absolute Maximum Ratings at Ta = 25C
Parameter
Symbol
Conditions
Ratings
Unit
Supply voltage
VCC max
VG max
VCC pin
VG pin
37
V
42
V
Output current
Allowable Power dissipation
IO max1
IO max2
Pd max
*1
t  0.1ms *1
Mounted on a specified board *2
2.5
A
3.0
A
1.7
W
Operation temperature
Topr
-25 to +80
C
Storage temperature
Tstg
-55 to +150
C
Junction temperature
Tj max
150
C
*1. Tj max = 150C must not be exceeded.
*2. Specified board: 114.3mm × 76.1mm × 1.6mm, glass epoxy board.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
ORDERING INFORMATION
See detailed ordering and shipping information on page 15 of this data sheet.
Semiconductor Components Industries, LLC, 2014
August, 2014
82514HK/31412SY 20120224-S00003/O1409SY/60309MS/22509MS No.A1416-1/15