English
Language : 

LB1948MC-AH Datasheet, PDF (1/6 Pages) ON Semiconductor – 12V Low Saturation Voltage Drive Forward/Reverse Motor Driver
Ordering number : ENA2015
LB1948MC
Monolithic Digtal IC
12V Low Saturation Voltage Drive
Forward/Reverse Motor Driver
http://onsemi.com
Overview
The LB1948MC is a two-channel low saturation voltage forward/reverse motor driver IC. It is optimal for motor drive
in 12V system products and can drive either two DC motors, one DC motor using parallel connection, or a two-phase
bipolar stepping motor with 1-2 phase excitation mode drive.
Features
• Supports 12V power supply systems
• Low saturation voltage: VO(sat) = 0.5V (typical) at IO = 400mA
• Zero current drawn in standby mode
• Braking function
• Supports parallel connection: IO max = 1.6A, VO(sat) = 0.6V (typical) at IO = 800mA
• Built-in spark killer diode
• Built-in thermal shutdown circuit
• Miniature package: MFP-10S (6.4mm × 5.0mm)
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Maximum supply voltage
Output voltage
Input voltage
Ground pin source current
Allowable power dissipation
VCC max
VOUT
VIN
IGND
Pd max
Per channel
Mounted on a specified board*
-0.3 to +20
V
-0.3 to +20
V
-0.3 to +18
V
800
mA
870 mW
Operating temperature
Topr
-20 to +85
°C
Storage temperature
Tstg
-40 to +150
°C
* Specified board: 114.3mm × 76.1mm × 1.6mm, glass epoxy board.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
June, 2013
30712 SY 20111213-S00004 No.A2015-1/6