LB1862MC-AH Datasheet, PDF (1/7 Pages) ON Semiconductor – Single-Phase Full-Wave Driver

Ordering number : ENA2024
LB1862MC
Monolithic Digital IC
For Fan Motor
Single-Phase Full-Wave Driver
http://onsemi.com
Overview
Single-phase full-wave drive design and a compact package make these ICs optimal for small fans (especially CPU
cooling fans). Low switching noise and effective motor drive are further advantages.
Functions
• Support for 5V/12V dual power supply voltage
• Built-in regenerative circuit allows use of reverse connection protection diode
• Built-in Hall amplifier with hysteresis (supports core without auxiliary electrode)
• Built-in lockup protection and automatic recovery circuits
• Latch-type lockup detection output (RD) is Low during rotation and High during stop
• Hall bias pin and start/stop pin allow reduced current drain in standby mode
• Built-in thermal protection circuit
Specifications
Absolute Maximum Ratings at Ta = 25°C
Parameter
Symbol
Conditions
Ratings
Unit
Maximum supply voltage
Maximum output current
Maximum output withstand voltage
RD maximum output withstand voltage
RD maximum output current
HB maximum output current
ST maximum input voltage
Allowable power dissipation
VCC max
IOUT max
VOUT max
VRD max
IRD max
IB max
VST max
Pd max
Mounted on a specified board *
17
V
0.5
A
17
V
17
V
5
mA
10
mA
15
V
850
mW
Operating temperature
Topr
-30 to +90
°C
Storage temperature
Tstg
-55 to +150
°C
* Specified board: 114.3mm × 76.2mm × 1.5mm, glass epoxy board.
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
May, 2013
31412 SY 20120127-S00004 No.A2024-1/7