KAI-47051 Datasheet, PDF (1/38 Pages) ON Semiconductor – 8856 (H) x 5280 (V) Interline CCD Image Sensor

KAI-47051
8856 (H) x 5280 (V) Interline
CCD Image Sensor
Description
The KAI−47051 Image Sensor is a 47−megapixel CCD designed for
the most demanding inspection and surveillance applications. Based
on an advanced 5.5−micron Interline Transfer CCD Platform, the
sensor features broad dynamic range and excellent imaging
performance and uniformity. Full resolution readout of up to 7 frames
per second is enabled through a multi−tap output architecture, and a
vertical overflow drain structure suppresses image blooming and
enables electronic shuttering for precise exposure control.
The sensor is electrically similar to other devices in the 5.5−micron
Interline Transfer CCD Platform, allowing cameras designed for that
platform to be leveraged in support of this high−resolution device.
Table 1. GENERAL SPECIFICATIONS
Parameter
Architecture
Total Number of Pixels
Number of Effective Pixels
Number of Active Pixels
Pixel Size
Active Image Size
Typical Value
Interline CCD, Progressive Scan
8880 (H) × 5392 (V)
8880 (H) × 5304 (V)
8856 (H) × 5280 (V)
5.5 mm (H) × 5.5 mm (V)
48.7 mm (H) × 29.0 mm (V)
56.7 mm (diagonal)
Aspect Ratio
Number of Outputs
Charge Capacity
Output Sensitivity
Quantum Efficiency
Pan (−AXA, −QXA)
R, G, B (−FXA, −QXA)
Read Noise (f = 40 MHz)
Dark Current
Photodiode / VCCD
5:3
8 or 16
20,000 electrons
38 mV/e^−
43%
28%, 35%, 38%
10 e^− rms
7 / 140 e^−/s
Dark Current Doubling Temp
Photodiode / VCCD
7°C / 9°C
Dynamic Range
Charge Transfer Efficiency
66 dB
0.999999
Blooming Suppression
Smear
Image Lag
> 300 X
−100 dB
< 10 electrons
Maximum Pixel Clock Speed
Maximum Frame Rate
8 Outputs / 16 Outputs
40 MHz
3.5 fps / 7.0 fps
Package Options
201 Pin PGA
Cover Glass
AR Coated, 2-Sides
NOTE: All Parameters are specified at T = 40°C unless otherwise noted.
www.onsemi.com
Figure 1. KAI−47051 Image Sensor
Features
• Bayer Color Pattern, Sparse Color Filter
Pattern, and Monochrome Configurations
• Progressive Scan Readout
• Flexible Readout Architecture
• High Frame Rate
• High Sensitivity
• Low Noise Architecture
• Excellent Smear Performance
Applications
• Industrial Imaging and Inspection
• Aerial Surveillance
• Security
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2015
1
November, 2015 − Rev. 0
Publication Order Number:
KAI−47051/D