KAI-04070 Datasheet, PDF (1/50 Pages) ON Semiconductor – INTERLINE CCD IMAGE SENSOR

KAI-04070
2048 (H) x 2048 (V) Interline
CCD Image Sensor
Description
The KAI−04070 Image Sensor is a 4-megapixel CCD in a 4/3 inch
optical format. Based on the TRUESENSE 7.4 micron Interline
Transfer CCD Platform, the sensor provides very high smear rejection
and up to 82 dB linear dynamic range through the use of a unique
dual-gain amplifier. A flexible readout architecture enables use of 1, 2,
or 4 outputs for full resolution readout up to 28 frames per second,
while a vertical overflow drain structure suppresses image blooming
and enables electronic shuttering for precise exposure control.
Table 1. GENERAL SPECIFICATIONS
Parameter
Architecture
Total Number of Pixels
Number of Effective Pixels
Number of Active Pixels
Pixel Size
Active Image Size
Aspect Ratio
Number of Outputs
Charge Capacity
Output Sensitivity
Quantum Efficiency
Pan (−ABA, −PBA, −QBA)
R, G, B (−CBA)
R, G, B (−FBA)
Read Noise (f = 40 MHz)
Dark Current
Photodiode
VCCD
Typical Value
Interline CCD, Progressive Scan
2128 (H) × 2112 (V)
2080 (H) × 2080 (V)
2048 (H) × 2048 (V)
7.4 mm (H) × 7.4 mm (V)
15.2 mm (H) × 15.2 mm (V),
21.4 mm (Diagonal),
4/3″ Optical Format
1:1
1, 2, or 4
44,000 electrons
8.7 mV/e^− (Low), 33 mV/e^− (High)
52%
38%, 42%, 43%
37%, 42%, 41%
12 e^− rms
3 e^−/s
145 e^−/s
Dark Current Doubling Temp.
Photodiode
7°C
VCCD
9°C
Dynamic Range
High Gain Amp (40 MHz)
Dual Amp, 2×2 Bin (40 MHz)
70 dB
82 dB
Charge Transfer Efficiency
Blooming Suppression
Smear
Image Lag
Maximum Pixel Clock Speed
Maximum Frame Rate
Quad Output
Dual Output
Single Output
0.999999
> 1000 X
−115 dB
< 10 electrons
40 MHz
28 fps
14 fps
8 fps
Package
68 Pin PGA
Cover Glass
AR Coated, 2 Sides
NOTE: All Parameters are specified at T = 40°C unless otherwise noted.
www.onsemi.com
Figure 1. KAI−04070 Interline CCD
Image Sensor
Features
• Superior Smear Rejection
• Up to 82 dB Linear Dynamic Range
• Bayer Color Pattern, TRUESENSE Sparse
Color Filter Pattern, and Monochrome
Configurations
• Progressive Scan & Flexible Readout
Architecture
• High Frame Rate
• High Sensitivity − Low Noise Architecture
• Package Pin Reserved for Device
Identification
Application
• Industrial Imaging and Inspection
• Traffic
• Surveillance
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2015
1
July, 2015 − Rev. 3
Publication Order Number:
KAI−04070/D