CM1641_11 Datasheet, PDF (1/6 Pages) ON Semiconductor – 4-Channel Low Capacitance Dual-Voltage ESD Protection Array

CM1641
4-Channel Low
Capacitance Dual-Voltage
ESD Protection Array
Features
• Three Channels of Low Voltage ESD Protection
• One Channel of High Voltage ESD Protection
• Provides ESD Protection to IEC61000−4−2 Level 4:
♦ ±8 kV Contact Discharge (Pins 1−3)
♦ ±15 kV Contact Discharge (Pin 4)
• Low Channel Input Capacitance
• Minimal Capacitance Change with Temperature and Voltage
• High Voltage Zener Diode Protects Supply Rail
• No Need for External Bypass Capacitors
• Each I/O Pin can Withstand over 1000 ESD Strikes*
• These Devices are Pb−Free and are RoHS Compliant
TYPICAL APPLICATION
V_CC
http://onsemi.com
UDFN8
D4 SUFFIX
CASE 517BC
ELECTRICAL SCHEMATIC
V_P (Internal)
V_CC
Pin 4
CH1 ^{Pin 1}
CH2 ^{Pin 2}
LV
HV
CH3 ^{Pin 3}
High−Speed
Data Lines
CH1 (1)
CH2 (2)
CH3 (3)
V_CC (4)
* Die Attach Pad
on Back of Package
(Connect to Ground)
Note: All grounds must be connected.
DAP*
V_N (8)
V_N (7)
V_N (6)
GND (5)
Pins 6 − 8
V_N
Pin 5
GND
Note: Pins 5 and 6 to 8 are connected
to a common substrate.
MARKING DIAGRAM
P41 MG
1
G
P41 = CM1641−04D4
M
= Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Device
CM1641−04D4
Package
UDFN−8
0.4 mm
(Pb−Free)
Shipping^†
3000/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
*Standard test condition is IEC61000−4−2 level 4 test circuit with each pin subjected to ±8 kV contact discharge for 1000 pulses. Discharges
are timed at 1 second intervals and all 1000 strikes are completed in one continuous test run. The part is then subjected to standard production
test to verify that all of the tested parameters are within spec after the 1000 strikes.
© Semiconductor Components Industries, LLC, 2011
1
April, 2011 − Rev. 5
Publication Order Number:
CM1641/D