74HCT4851 Datasheet, PDF (9/20 Pages) NXP Semiconductors – 8-channel analog multiplexer/demultiplexer with injection-current effect control

NXP Semiconductors
74HC4851; 74HCT4851
8-channel analog MUX/DEMUX with injection-current effect control
E
V_IH
IS ^Yn
VI
V_CC
Z
IS
GND
VO
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Fig 6. Test circuit for measuring OFF-state leakage
current
Yn
IS
V_CC
selected
channel⁽¹⁾
VI
E
V_IL
Z
n.c.
Yn
any disabled
channel
VO
GND
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(1) Channel is selected by S0, S1 and S2.
Fig 7. Test circuit for measuring ON-state leakage
current
VSW
V
V_CC
E
V_IL
Yn
Z
VI
GND
R_ON = V_SW / I_SW.
ISW
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Fig 8. Test circuit for measuring ON resistance
V_I(1)
ISW
V_IL
V_I(2)
RS
VI
V_CC
any disabled
channel
Yn
Z
E
Yn
selected
channel⁽¹⁾
GND
V_O
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(1) Channel is selected by S0, S1 and S2.
V_I(1) < GND or V_I(1) > V_CC.
GND < V_I(2) < V_CC.
Fig 9. Test circuit for injection current coupling
74HC_HCT4851_2
Product data sheet
Rev. 02 — 2 September 2008
© NXP B.V. 2008. All rights reserved.
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