74HC4851-Q100 Datasheet, PDF (9/21 Pages) NXP Semiconductors – 8-channel analog multiplexer/demultiplexer with injection-current effect control

NXP Semiconductors
74HC4851-Q100; 74HCT4851-Q100
8-channel analog multiplexer/demultiplexer with injection-current
effect control
E
V_IH
Yn
IS
VI
V_CC
Z
IS
GND
VO
IS ^Yn
V_CC
selected
channel⁽¹⁾
VI
E
V_IL
Z
n.c.
Yn
any disabled
channel
VO
GND
001aaf878
Fig 6. Test circuit for measuring OFF-state leakage
current
001aaf879
Fig 7.
(1) Channel is selected by S0, S1 and S2.
Test circuit for measuring ON-state leakage
current
VSW
V
V_CC
E
V_IL
Yn
Z
VI
GND
R_ON = V_SW / I_SW.
ISW
001aaf880
Fig 8. Test circuit for measuring ON resistance
V_I(1)
ISW
V_IL
V_I(2)
RS
VI
V_CC
any disabled
channel
Yn
Z
E
Yn
selected
channel⁽¹⁾
GND
V_O
001aaf881
Fig 9.
(1) Channel is selected by S0, S1 and S2.
V_I(1) < GND or V_I(1) > V_CC.
GND < V_I(2) < V_CC.
Test circuit for injection current coupling
74HC_HCT4851_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 2 August 2012
© NXP B.V. 2012. All rights reserved.
9 of 21