English
Language : 

74AUP1G09 Datasheet, PDF (9/15 Pages) NXP Semiconductors – Low-power 2-input AND gate with open-drain
NXP Semiconductors
74AUP1G09
Low-power 2-input AND gate with open-drain
VCC
VEXT
G
VI
VO
DUT
5 kΩ
RT
CL
RL
001aac521
Fig 8.
Test data is given in Table 10.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
Load
VCC
0.8 V to 3.6 V
CL
5 pF, 10 pF, 15 pF and 30 pF
RL[1]
5 kΩ or 1 MΩ
VEXT
tPLH, tPHL
open
[1] For measuring enable and disable times RL = 5 kΩ.
For measuring propagation delays, set-up and hold times, and pulse width, RL = 1 MΩ.
tPZH, tPHZ
GND
tPZL, tPLZ
2VCC
74AUP1G09_1
Product data sheet
Rev. 01 — 15 January 2009
© NXP B.V. 2009. All rights reserved.
9 of 15