PESDXV4UF Datasheet, PDF (8/16 Pages) NXP Semiconductors – Very low capacitance unidirectional quadruple ESD protection diode arrays

NXP Semiconductors
PESDxV4UF/G/W
Very low capacitance quadruple ESD protection diode arrays
ESD TESTER
R_Z
C_Z
IEC 61000-4-2 network
C_Z = 150 pF; R_Z = 330 Ω
450 Ω
RG 223/U
50 Ω coax
DUT
Device
Under
Test
10×
ATTENUATOR
4 GHz DIGITAL
OSCILLOSCOPE
50 Ω
vertical scale = 200 V/div
horizontal scale = 50 ns/div
GND
vertical scale = 5 V/div
horizontal scale = 50 ns/div
PESD3V3V4UF/G/W
GND
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
PESD5V0V4UF/G/W
GND
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
GND
GND
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
Fig 8. ESD clamping test setup and waveforms
vertical scale = 5 V/div
horizontal scale = 50 ns/div
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
006aab125
PESDXV4UF_G_W_3
Product data sheet
Rev. 03 — 28 January 2008
© NXP B.V. 2008. All rights reserved.
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