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74LVC1G97GS Datasheet, PDF (8/20 Pages) NXP Semiconductors – Low-power configurable multiple function gate
NXP Semiconductors
74LVC1G97
Low-power configurable multiple function gate
Table 10. Measurement points
Supply voltage
Input
VCC
1.65 V to 1.95 V
2.3 V to 2.7 V
2.7 V
VM
0.5VCC
0.5VCC
1.5 V
3.0 V to 3.6 V
1.5 V
4.5 V to 5.5 V
0.5VCC
VI
VCC
VCC
2.7 V
2.7 V
VCC
Output
VM
0.5VCC
0.5VCC
1.5 V
1.5 V
0.5VCC
VI
G
VCC
VO
DUT
RT
VEXT
RL
CL
RL
mna616
Measurement points are given in Table 11.
Definitions test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 13. Test circuit for measuring switching times
Table 11. Measurement points
Supply voltage
VCC
1.65 V to 1.95 V
2.3 to 2.7 V
2.7 V
3.0 V to 3.6 V
4.5 V to 5.5 V
Input
VI
VCC
VCC
2.7 V
2.7 V
VCC
tr = tf
 2.0 ns
 2.0 ns
 2.5 ns
 2.5 ns
 2.5 ns
Load
CL
30 pF
30 pF
50 pF
50 pF
50 pF
RL
1 k
500 
500 
500 
500 
VEXT
tPLH, tPHL
open
open
open
open
open
74LVC1G97
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 7 December 2011
© NXP B.V. 2011. All rights reserved.
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