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LPC2927 Datasheet, PDF (75/95 Pages) NXP Semiconductors – ARM9 microcontroller with CAN, LIN, and USB
NXP Semiconductors
LPC2927/2929
ARM9 microcontroller with CAN, LIN, and USB
9.3 Dynamic characteristics: I2C-bus interface
Table 38. Dynamic characteristic: I2C-bus pins
VDD(CORE) = VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to
ground; positive currents flow into the IC; unless otherwise specified[1]
Symbol
Parameter
Conditions
Min
Typ[2] Max
Unit
tf(o)
output fall time
VIH to VIL
20 + 0.1 × Cb[3] -
-
ns
[1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 85 °C ambient
temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated
test conditions to cover the specified temperature and power supply voltage range.
[2] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages.
[3] Bus capacitance Cb in pF, from 10 pF to 400 pF.
LPC2927_29_2
Preliminary data sheet
Rev. 02 — 22 June 2009
© NXP B.V. 2009. All rights reserved.
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