NX3L1G3157 Datasheet, PDF (7/18 Pages) NXP Semiconductors – Low-ohmic, single-pole, double-throw switch

NXP Semiconductors
NX3L1G3157
Low-ohmic, single-pole, double-throw switch
11.3 ON resistance test circuit and graphs
V_CC
V_SW
V
S
V_IL or V_IH
Z
VI
Y0 1 _switch
Y1 2
GND
R_ON = V_SW/I_SW.
switch S
1
V_IL
2
V_IH
ISW
001aag563
Fig 6. Test circuit for measuring ON resistance
1.6
R_ON
(Ω)
1.2
001aag564
(1)
0.8
(2)
0.4
(3) (4) (5)
0
0
1
2
3
4
V_I (V)
(1) V_CC = 1.5 V.
(2) V_CC = 1.8 V.
(3) V_CC = 2.5 V.
(4) V_CC = 2.7 V.
(5) V_CC = 3.3 V.
Measured at T_amb = 25 °C.
Fig 7. Typical ON resistance as a function of input
voltage
1.6
R_ON
(Ω)
1.2
0.8
0.4
001aag565
(1)
(2)
(3)
(4)
1.0
R_ON
(Ω)
0.8
0.6
0.4
0.2
001aag566
(1)
(2)
(3)
(4)
0
0
1
2
3
V_I (V)
0
0
1
2
3
V_I (V)
(1) T_amb = 125 °C.
(2) T_amb = 85 °C.
(3) T_amb = 25 °C.
(4) T_amb = −40 °C.
Fig 8. ON resistance as a function of input voltage;
V_CC = 1.5 V
(1) T_amb = 125 °C.
(2) T_amb = 85 °C.
(3) T_amb = 25 °C.
(4) T_amb = −40 °C.
Fig 9. ON resistance as a function of input voltage;
V_CC = 1.8 V
NX3L1G3157_1
Product data sheet
Rev. 01 — 8 October 2007
© NXP B.V. 2007. All rights reserved.
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