MFRC523 Datasheet, PDF (65/98 Pages) NXP Semiconductors – Contactless reader IC

NXP Semiconductors
MFRC523
Contactless reader IC
Table 130. AutoTestReg register bit descriptions
Bit Symbol Value Description
7
reserved -
reserved for production tests
6
AmpRcv 1
internal signal processing in the receiver chain is performed
non-linearly which increases the operating distance in communication
modes at 106 kBd
Remark: due to non-linearity, the effect of the RxThresholdReg
register’s MinLevel[3:0] and the CollLevel[2:0] values is also
non-linear
5 to 4 RFT
-
reserved for production tests
3 to 0 SelfTest -
[3:0]
enables the digital self test
the self test can also be started by the CalcCRC command; see
Section 10.3.1.4 on page 70
the self test is enabled by 1001b
Remark: for default operation the self test must be disabled by 0000b
9.2.4.8 VersionReg register
Shows the MFRC523 software version.
Table 131. VersionReg register (address 37h); reset value: xxh bit allocation
Bit
7
6
5
4
3
2
1
0
Symbol
Version[7:0]
Access
R
Table 132. VersionReg register bit descriptions
Bit
Symbol
Description
7 to 0 Version[7:0] indicates current software version of the MFRC523
Remark: the current version of the MFRC523 is 90h or 91h
9.2.4.9 AnalogTestReg register
Determines the analog output test signal at, and status of, pins AUX1 and AUX2.
Table 133. AnalogTestReg register (address 38h); reset value: 00h bit allocation
Bit
7
6
5
4
3
2
1
0
Symbol
AnalogSelAux1[3:0]
AnalogSelAux2[3:0]
Access
R/W
R/W
MFRC523_33
Product data sheet
PUBLIC
All information provided in this document is subject to legal disclaimers.
Rev. 3.3 — 5 March 2010
115233
© NXP B.V. 2010. All rights reserved.
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