KMA220 Datasheet, PDF(6/36 Page) NXP Semiconductors – Dual channel programmable angle sensor

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KMA220 Datasheet, PDF (6/36 Pages) NXP Semiconductors – Dual channel programmable angle sensor

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NXP Semiconductors

KMA220

Dual channel programmable angle sensor

(%VDD)

V(CL)u

Î±rng

V(CL)I

0 Î±ref

Î±max

180

Î± (deg)

Î±sw(CL)

Î±ref + 180Â°

001aag811

ï¡max = ï¡ref + ï¡rng

Fig 3. Characteristic of each analog output

7. Diagnostic features

Each channel provides several diagnostic features:

7.1 CRC and EDC supervision

Each channel of the KMA220 includes a supervision of the programmed data.

At power-on, a CRC of the non-volatile memory is performed. Furthermore the memory is

protected against bit errors. Every 16-bit data word is saved internally as a 22-bit word for

this purpose. The protection logic corrects any single-bit error in a data word, while the

sensor continues in normal operation mode. Furthermore the logic detects double-bit error

per word and switches the output into diagnostic mode.

7.2 Magnet-loss detection

If the applied magnetic field strength is not sufficient, each channel of the KMA220 can

raise a diagnostic condition. In order to enter the diagnostic mode, due to magnet-loss,

enable the detection first. Both channels can be programmed independently into active

diagnostic mode, where the output is driven below 4 %VDD or above 96 %VDD.

7.3 Power-loss detection

The power-loss detection circuit enables the detection of an interrupted supply or ground

line of the mixed signal IC. If there is a power-loss condition, two internal switches in the

sensor are closed, connecting the pin of the analog output to the supply voltage and the

ground pins.

KMA220

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 1 â 24 May 2012

6 of 36

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