74HC1G14 Datasheet, PDF (4/14 Pages) NXP Semiconductors – Inverting Schmitt-trigger

NXP Semiconductors
74HC1G14; 74HCT1G14
Inverting Schmitt trigger
11. Static characteristics
Table 7. Static characteristics
Voltages are referenced to GND (ground = 0 V). All typical values are measured at T_amb = 25 °C.
Symbol Parameter
Conditions
−40 °C to +85 °C
−40 °C to +125 °C
Min Typ Max Min
Max
For type 74HC1G14
V_OH
HIGH-level output
V_I = V_IH or V_IL
voltage
I_O = −20 µA; V_CC = 2.0 V
1.9 2.0
-
1.9
I_O = −20 µA; V_CC = 4.5 V
4.4 4.5
-
4.4
I_O = −20 µA; V_CC = 6.0 V
5.9 6.0
-
5.9
I_O = −2.0 mA; V_CC = 4.5 V
4.13 4.32 -
3.7
I_O = −2.6 mA; V_CC = 6.0 V
5.63 5.81 -
5.2
V_OL
LOW-level output
V_I = V_IH or V_IL
voltage
I_O = 20 µA; V_CC = 2.0 V
-
0 0.1
-
I_O = 20 µA; V_CC = 4.5 V
-
0 0.1
-
I_O = 20 µA; V_CC = 6.0 V
-
0 0.1
-
I_O = 2.0 mA; V_CC = 4.5 V
- 0.15 0.33
-
I_O = 2.6 mA; V_CC = 6.0 V
- 0.16 0.33
-
I_I
input leakage current V_I = V_CC or GND; V_CC = 6.0 V
-
-
1.0
-
I_CC
supply current
V_I = V_CC or GND; I_O = 0 A;
V_CC = 6.0 V
-
-
10
-
C_I
input capacitance
-
1.5
-
-
V_T+
positive-going
see Figure 7 and 8
threshold voltage
V_CC = 2.0 V
0.7 1.09 1.5
0.7
V_CC = 4.5 V
1.7 2.36 3.15 1.7
V_CC = 6.0 V
2.1 3.12 4.2
2.1
V_T−
negative-going
see Figure 7 and 8
threshold voltage
V_CC = 2.0 V
0.3 0.60 0.9
0.3
V_CC = 4.5 V
0.9 1.53 2.0
0.9
V_CC = 6.0 V
1.2 2.08 2.6
1.2
V_H
hysteresis voltage
see Figure 7 and 8
V_CC = 2.0 V
0.2 0.48 1.0
0.2
V_CC = 4.5 V
0.4 0.83 1.4
0.4
V_CC = 6.0 V
0.6 1.04 1.6
0.6
For type 74HCT1G14
-
-
-
-
-
0.1
0.1
0.1
0.4
0.4
1.0
20
-
1.5
3.15
4.2
0.9
2.0
2.6
1.0
1.4
1.6
V_OH
HIGH-level output
V_I = V_IH or V_IL
voltage
I_O = −20 µA; V_CC = 4.5 V
4.4 4.5
-
4.4
-
I_O = −2.0 mA; V_CC = 4.5 V
4.13 4.32 -
3.7
-
V_OL
LOW-level output
V_I = V_IH or V_IL
voltage
I_O = 20 µA; V_CC = 4.5 V
-
0 0.1
-
0.1
I_O = 2.0 mA; V_CC = 4.5 V
- 0.15 0.33
-
0.4
I_I
input leakage current V_I = V_CC or GND; V_CC = 5.5 V
-
-
1.0
-
1.0
Unit
V
V
V
V
V
V
V
V
V
V
µA
µA
pF
V
V
V
V
V
V
V
V
V
V
V
V
V
µA
74HC_HCT1G14_4
Product data sheet
Rev. 04 — 17 July 2007
© NXP B.V. 2007. All rights reserved.
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