LPC2387 Datasheet, PDF (37/47 Pages) NXP Semiconductors – Single-chip 16-bit/32-bit microcontrollers; 512 kB flash with ISP/IAP, Ethernet, USB 2.0, CAN, and 10-bit ADC/DAC

LPC2387 NXP Semiconductors
Table 6. ADC static characteristics …continued
V_DDA = 2.5 V to 3.6 V; T_amb = −40 °C to +85 °C unless otherwise
Symbol
Parameter
Conditions
E_G
gain error
E_T
absolute error
R_vsi
voltage source interface
resistance
specifie_[[11d_]][[[;_678]]]AD_---MC_infrequenc^Dy_---T^R4_y^A._p^F5^TFM^DaRH^sADz^tFR.^cTAoDF_±±4M^mTR₀₄₀^AD_a^m_.^FR_5x^{TDAuDRFnTRAiAFDcTFRaTADtiDFRo}_%LkU^TRDA_Ωⁿ_SAn^RFD_B^TFA_i^Rc_{tTFADhTDFRiTRDApARDFTFDARTRFADTADFRTFRDATADRF}
[1] Conditions: V_SSA = 0 V, V_DDA = 3.3 V.
[2] The ADC is monotonic, there are no missing codes.
[3] The differential linearity error (E_D) is the difference between the actual step width and the ideal step width. See Figure 4.
[4] The integral non-linearity (E_L(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 4.
[5] The offset error (E_O) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 4.
[6] The gain error (E_G) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 4.
[7] The absolute error (E_T) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 4.
[8] See Figure 5.
LPC2387_1
Product data sheet
Rev. 01.00 — 6 November 2007
© NXP B.V. 2007. All rights reserved.
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