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TJA1029 Datasheet, PDF (12/24 Pages) NXP Semiconductors – LIN 2.2A/SAE J2602 transceiver with TXD dominant timeout
NXP Semiconductors
TJA1029
LIN 2.2A/SAE J2602 transceiver with TXD dominant timeout
Table 7. Static characteristics …continued
VBAT = 5 V to 18 V; Tvj = 40 C to +150 C; RL(LIN-VBAT) = 500 ; all voltages are referenced to pin GND; positive currents
flow into the IC; typical values are given at VBAT = 12 V; unless otherwise specified.[1]
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Pin LIN
IBUS_LIM
IBUS_PAS_dom
current limitation for driver
dominant state
receiver dominant input
leakage current including
pull-up resistor
VBAT = 18 V; VLIN = 18 V;
VTXD = 0 V
VBAT = 12 V; VLIN = 0 V;
VTXD = 5 V
40
-
[2] 600
-
100
mA
-
A
IBUS_PAS_rec
IBUS_NO_GND
IBUS_NO_BAT
receiver recessive input
leakage current
VBAT = 5 V; VLIN = 18 V;
VTXD = 5 V
loss-of-ground bus current VBAT = 18 V; VLIN = 0 V
loss-of-battery bus current VBAT = 18 V; VLIN = 18 V
[2] -
0
[2] 750
-
[2] -
-
1
A
+10
A
1
A
VBUSdom
receiver dominant state
-
-
0.4VBAT V
VBUSrec
receiver recessive state
0.6VBAT -
-
V
VBUS_CNT
VHYS
VSerDiode
VO(dom)
Rslave
CLIN
receiver center voltage
VBUS_CNT =
(VBUSdom + VBUSrec) / 2
receiver hysteresis voltage VHYS = VBUSrec  VBUSdom
voltage drop at the serial in pull-up path with Rslave;
diode
ISerDiode = 0.9 mA
dominant output voltage
Normal mode; VTXD = 0 V;
VBAT = 7.0 V
Normal mode; VTXD = 0 V;
VBAT = 18 V
slave resistance
capacitance on pin LIN with respect to GND
0.475VBAT 0.5VBAT 0.525VBAT V
-
-
[2] 0.4
-
0.175VBAT V
1.0
V
[2] -
-
1.4
V
[2] -
-
2.0
V
20
30
60
k
[2] -
-
20
pF
Thermal shutdown
Tj(sd)
shutdown junction
temperature
[2] 150
-
200
C
[1] All parameters are guaranteed over the virtual junction temperature range by design. Factory testing uses correlated test conditions to
cover the specified temperature and power supply voltage range.
[2] Not tested in production; guaranteed by design.
TJA1029
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 8 January 2013
© NXP B.V. 2013. All rights reserved.
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