NX3L1G384 Datasheet, PDF (12/17 Pages) NXP Semiconductors – Low-ohmic single-pole single-throw analog switch

NXP Semiconductors
NX3L1G384
Low-ohmic single-pole single-throw analog switch
a. Test circuit
G _{VI V VO}
RL
V_CC
E
Y/Z
Z/Y ^Rgen
CL
GND
V_gen
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logic
input (E)
off
on
off
V_O
b. Input and output pulse definitions
Definition: Q_inj = ∆V_O × C_L.
∆V_O = output voltage variation.
R_gen = generator resistance.
V_gen = generator voltage.
Fig 21. Test circuit for measuring charge injection
V_O
001aai608
NX3L1G384_3
Product data sheet
Rev. 03 — 17 August 2009
© NXP B.V. 2009. All rights reserved.
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