74HC74 Datasheet, PDF (12/21 Pages) NXP Semiconductors – Dual D-type flip-flop with set and reset; positive-edge trigger

NXP Semiconductors
74HC74; 74HCT74
Dual D-type flip-flop with set and reset; positive edge-trigger
V_{I 90 %}
negative
pulse
GND
V_I
positive
pulse
10 %
GND
V_M
10 %
t_f
t_r
90 %
V_M
VI
G
RT
t_W
t_W
V_CC
DUT
V_M
t_r
t_f
V_M
VO
CL
001aah768
Fig 9.
Test data is given in Table 10.
Definitions test circuit:
R_T = Termination resistance should be equal to output impedance Z_o of the pulse generator.
C_L = Load capacitance including jig and probe capacitance.
R_L = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
74HC74
74HCT74
V_I
t_r, t_f
V_CC
6 ns
3V
6 ns
Load
C_L
15 pF, 50 pF
15 pF, 50 pF
R_L
1 k
1 k
Test
t_PLH, t_PHL
t_PLH, t_PHL
74HC_HCT74
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 27 August 2012
© NXP B.V. 2012. All rights reserved.
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