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74LVC1G38 Datasheet, PDF (1/15 Pages) NXP Semiconductors – 2-input NAND gate; open drain
74LVC1G38
2-input NAND gate; open drain
Rev. 03 — 27 August 2007
Product data sheet
1. General description
The 74LVC1G38 provides a 2-input NAND function.
Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this
device as translator in a mixed 3.3 V and 5 V environment.
This device is fully specified for partial power-down applications using IOFF. The IOFF
circuitry disables the output, preventing the damaging backflow current through the device
when it is powered down.
2. Features
I Wide supply voltage range from 1.65 V to 5.5 V
I 5 V tolerant outputs for interfacing with 5 V logic
I High noise immunity
I Complies with JEDEC standard:
N JESD8-7 (1.65 V to 1.95 V)
N JESD8-5 (2.3 V to 2.7 V)
N JESD8-B/JESD36 (2.7 V to 3.6 V).
I ESD protection:
N HBM JESD22-A114E exceeds 2000 V
N MM JESD22-A115-A exceeds 200 V
I ±24 mA output drive (VCC = 3.0 V)
I CMOS low power consumption
I Open drain outputs
I Latch-up performance exceeds 250 mA
I Direct interface with TTL levels
I Inputs accept voltages up to 5 V
I Multiple package options
I Specified from −40 °C to +125 °C.