74AUP1G74 Datasheet, PDF (1/24 Pages) NXP Semiconductors – Low-power D-type flip-flop with set and reset; positive-edge trigger

74AUP1G74
Low-power D-type flip-flop with set and reset; positive-edge
trigger
Rev. 04 — 3 June 2008
Product data sheet
1. General description
The 74AUP1G74 provides a low-power, low-voltage single positive-edge triggered D-type
flip-flop with individual data (D), clock (CP), set (SD) and reset (RD) inputs and
complementary Q and Q outputs. The SD and RD are asynchronous active LOW inputs
and operate independently of the clock input. Information on the data input is transferred
to the Q output on the LOW-to-HIGH transition of the clock pulse. The D input must be
stable one set-up time prior to the LOW-to-HIGH clock transition for predictable operation.
Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall
times across the entire V_CC range from 0.8 V to 3.6 V.
This device ensures a very low static and dynamic power consumption across the entire
V_CC range from 0.8 V to 3.6 V.
This device is fully specified for partial power-down applications using I_OFF. The I_OFF
circuitry disables the output, preventing the damaging backflow current through the device
when it is powered down.
2. Features
I Wide supply voltage range from 0.8 V to 3.6 V
I High noise immunity
I Complies with JEDEC standards:
N JESD8-12 (0.8 V to 1.3 V)
N JESD8-11 (0.9 V to 1.65 V)
N JESD8-7 (1.2 V to 1.95 V)
N JESD8-5 (1.8 V to 2.7 V)
N JESD8-B (2.7 V to 3.6 V)
I ESD protection:
N HBM JESD22-A114E Class 3A exceeds 5000 V
N MM JESD22-A115-A exceeds 200 V
N CDM JESD22-C101C exceeds 1000 V
I Low static power consumption; I_CC = 0.9 µA (maximum)
I Latch-up performance exceeds 100 mA per JESD 78 Class II
I Inputs accept voltages up to 3.6 V
I Low noise overshoot and undershoot < 10 % of V_CC
I I_OFF circuitry provides partial Power-down mode operation
I Multiple package options
I Specified from −40 °C to +85 °C and −40 °C to +125 °C