74AHC1G79GW125 Datasheet, PDF (1/12 Pages) NXP Semiconductors – Single D-type flip-flop; positive-edge trigger

74AHC1G79; 74AHCT1G79
Single D-type flip-flop; positive-edge trigger
Rev. 05 — 2 July 2007
Product data sheet
1. General description
74AHC1G79 and 74AHCT1G79 are high-speed Si-gate CMOS devices. They provide a
single positive-edge triggered D-type flip-flop.
Information on the data input is transferred to the Q output on the LOW-to-HIGH transition
of the clock pulse. The D input must be stable one set-up time prior to the LOW-to-HIGH
clock transition for predictable operation.
The AHC device has CMOS input switching levels and supply voltage range 2 V to 5.5 V.
The AHCT device has TTL input switching levels and supply voltage range 4.5 V to 5.5 V.
2. Features
I Symmetrical output impedance
I High noise immunity
I Low power dissipation
I Balanced propagation delays
I SOT353-1 and SOT753 package options
I ESD protection:
N HBM JESD22-A114E: exceeds 2000 V
N MM JESD22-A115-A: exceeds 200 V
N CDM JESD22-C101C: exceeds 1000 V
I Specified from −40 °C to +125 °C
3. Ordering information
Table 1. Ordering information
Type number Package
Temperature range Name
74AHC1G79GW −40 °C to +125 °C TSSOP5
74AHCT1G79GW
74AHC1G79GV −40 °C to +125 °C SC-74A
74AHCT1G79GV
Description
plastic thin shrink small outline package; 5 leads;
body width 1.25 mm
plastic surface-mounted package; 5 leads
Version
SOT353-1
SOT753