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NTE2941 Datasheet, PDF (2/3 Pages) NTE Electronics – MOSFET N-Ch, Enhancement Mode High Speed Switch
Electrical Characteristics: (TC = +25°C unless otherwise specified)
Parameter
Symbol
Test Conditions
Min Typ Max Unit
Drain–Source Breakdown Voltage
Gate Threshold Voltage
Gate–Source Leakage Forward
Gate–Source Leakage Reverse
Zero Gate Voltage Drain Current
Static Drain–Source ON Resistance
Forward Transconductance
BVDSS
VGS(th)
IGSS
IGSS
IDSS
RDS(on)
gfs
VGS = 0V, ID = 250µA
VDS = VGS, ID = 250µA
VGS = 20V
VGS = –20V
VDS = Max. Rating, VGS = 0
VDS = 0.8 Max. Rating, TC = +150°C
VGS = 10V, ID = 25A, Note 4
VDS ≥ 50V, ID = 25A, Note 4
60 –
–
V
2.0 – 4.0 V
– – 100 nA
– – –100 nA
– – 250 µA
– – 1000 µA
– – 0.028 Ω
15 –
– mho
s
Input Capacitance
Ciss VGS = 0V, VDS = 25V, f = 1MHz
– 2450 – pF
Output Capacitance
Coss
– 740 – pF
Reverse Transfer Capacitance
Crss
– 360 – pF
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
td(on) VDD = 0.5 BVDSS, ID = 50A, ZO = 9.1Ω,
–
tr
(MOSFET switching times are essentially
independent of operating temperature)
–
td(off)
–
– 32 ns
– 210 ns
– 75 ns
Fall Time
tf
– – 130 ns
Total Gate Charge
(Gate–Source Plus Gate–Drain)
Gate–Source Charge
Gate–Drain (“Miller”) Charge
Qg VGS = 10V, ID = 50A, VDS = 0.8 Max.
Qgs
Rating, (Gate charge is essentially
independent of operating temperature)
Qgd
– – 87 nC
– 26.6 – nC
– 30.6 – nC
Source–Drain Diode Ratings and Characteristics
Continuous Source Current
Pulse Source Current
Diode Forward Voltage
Reverse Recovery Time
IS (Body Diode)
ISM (Body Diode) Note 2
VSD TJ = +25°C, IS = 50A, VGS = 0V, Note 4
trr TJ = +25°C, IF = 50A, dIF/dt = 100A/µs
– – 150 A
– – 200 A
– – 2.5 V
– – 250 ns
Note 2. Repetitive Rating: Pulse width limited by maximum junction temperature.
Note 4. Pulse Test: Pulse Width ≤ 300µs, Duty Cycle ≤ 2%.