NTE8212 Datasheet, PDF(1/4 Page) NTE Electronics – Integrated Circuit Schottky, 8-Bit Input/Output Port

English

English German Russian Spanish Italian Polish Chinese Japanese Korean French Portuguese	Language :

NTE8212 Datasheet, PDF (1/4 Pages) NTE Electronics – Integrated Circuit Schottky, 8-Bit Input/Output Port

NTE8212

Integrated Circuit

Schottky, 8âBit Input/Output Port

Description:

The NTE8212 input/output port is an integrated circuit in a 24âLead DIP type package and consists

of an 8âbit latch with threeâstate output buffers along with control and device selection logic. Also

included is a service request flipâflop for the control and generation of interrupts to the microprocessor.

Features:

D Fully Parallel 8âBit Data Register and Buffer

D Service Request FlipâFlop for Interrupt Generation

D Low Input Load Current: 0.25mA Max

D Three State Outputs

D Outputs Sink 15mA

D 3.65V Output High Voltge for Direct Interface to 8080A Processor

D Asynchronous Register Clear

D Replaces Buffers, Latches and Multiplexers in Microcomputer Systems

D Reduces System Package Count

Absolute Maximum Ratings: (TA = +25Â°C, Note 1 unless otherwise specified)

All Output or Supply Voltages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . â0.5V to +7V

All Input Voltages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . â1.0V to +5.5V

Output Currents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125mA

Operating Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0Â° to +70Â°C

Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . â65Â° to +150Â°C

Note 1. Stress above those listed under âAbsolute Maximum Ratingsâ may cause permanent dam-

age to the device. This is a stress rating only and functional operation of the device at these

or any other conditions above those indicated in the operational sections of this specification

is not implied. Exposure to absolute maximum rating conditions for extended periods may

affect device reliability.

▷