THS4520 Datasheet, PDF (6/37 Pages) Texas Instruments – WIDEBAND, LOW NOISE, LOW DISTORTION FULLY DIFFERENTIAL AMPLIFIER WITH RAIL-TO-RAIL OUTPUTS

THS4520
SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
www.ti.com
SPECIFICATIONS; V_S+ – V_S– = 3.3 V:
Test conditions unless otherwise noted: V_S+ = +1.65 V, V_S– = –1.65 V, G = 0 dB, CM = open, V_O = 1 V_PP, R_F = 499 Ω,
R_L = 200 Ω Differential, T_A = 25°C Single-Ended Input, Differential Output, Input and Output Referenced to mid-supply
PARAMETER
TEST CONDITIONS
MIN
TYP MAX UNIT
TEST
LEVEL ⁽¹⁾
AC PERFORMANCE
Small-Signal Bandwidth
Gain-Bandwidth Product
G = 0 dB, V_O = 100 mV_PP
G = 6 dB, V_O = 100 mV_PP
G = 10 dB, V_O = 100 mV_PP
G = 20 dB, V_O = 100 mV_PP
G = 20 dB
600
400
310
120
1200
MHz
MHz
MHz
MHz
C
MHz
Bandwidth for 0.1 dB flatness
Large-Signal Bandwidth
Slew Rate (Differential)
G = 6 dB, V_O = 1 V_PP
G = 0 dB, V_O = 1 V_PP
30
MHz
210
MHz
320
V/μs
Rise Time
4
Fall Time
Settling Time to 1%
2-V Step
4
C
ns
6.6
Settling Time to 0.1%
2^nd Order Harmonic Distortion⁽²⁾
3^rd Order Harmonic Distortion⁽²⁾
3^rd Order Intermodulation Distortion
Input Voltage Noise
f = 100 kHz⁽³⁾
R_L = 1 kΩ
V_OD = 4 V_PP
f = 1 MHz⁽⁴⁾
R_L = 200 Ω
R_L = 1 kΩ
V_OD = 1 V_PP
V_OD = 2 V_PP
V_OD = 1 V_PP
V_OD = 2 V_PP
f = 8 MHz ⁽⁴⁾
R_L = 200 Ω
R_L = 1 kΩ
V_OD = 1 V_PP
V_OD = 2 V_PP
V_OD = 1 V_PP
V_OD = 2 V_PP
f = 100 kHz⁽³⁾
R_L = 1 kΩ
V_OD = 4 V_PP
f = 1 MHz ⁽⁴⁾
R_L = 200 Ω
R_L = 1 kΩ
V_OD = 1 V_PP
V_OD = 2 V_PP
V_OD = 1 V_PP
V_OD = 2 V_PP
f = 8 MHz ⁽⁴⁾
R_L = 200 Ω
R_L = 1 kΩ
V_OD = 1 V_PP
V_OD = 2 V_PP
V_OD = 1 V_PP
V_OD = 2 V_PP
f_C = 1 MHz ⁽⁴⁾, 100-kHz Tone Spacing,
R_L = 200 Ω, V_OD = 4 V_PP envelope, G = 10dB
f_C = 10 MHz ⁽⁴⁾, 100-kHz Tone Spacing,
R_L = 200 Ω, V_OD = 4 V_PP envelope, G = 10dB
f > 10 kHz
7.1
–135
–107
–101
–97
–103
–108
–106
–98
–99
–146
–112
–105
–94
–103
–95
–90
–95
–102
-80
-80
2
dBc
C
dBc
C
dBc
C
nV/√Hz
Input Current Noise
f > 10 kHz
2
pA/√Hz
(1) Test levels: (A) 100% tested at 25°C. Overtemperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
(2) For additional information, see the Typical Characteristics section and the Apllications section.
(3) Data collected with applied differential input signal and measured differential output signal.
(4) Data collected with applied single-ended input signal and measured differential output signal. See Figure 55 in the Applications/Test
Circuits section for additional information.
6
Submit Documentation Feedback