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MNDM54LS20 Datasheet, PDF (5/6 Pages) National Semiconductor (TI) – DUAL 4-INPUT NAND GATE
MNDM54LS20-X REV 1A0
MICROCIRCUIT DATA SHEET
(Continued)
Note 3:
Note 4:
Note 5:
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C
temperature, subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, subgroup A9.
Subgroups 10 & 11 are guaranteed, not tested.
Guaranteed, not tested.
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