MN54ACT2525-X Datasheet, PDF (5/5 Pages) National Semiconductor (TI) – 1-to-8 Minimum Skew Clock Driver

MN54ACT2525-X REV 2A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF, RL=500 OHMS, TR/TF=3.0ns, Temp range: -55C to +125C. NOTE: -55C TEMPERATURE, SUBGROUP 11 IS
GUARANTEED BUT NOT TESTED.
SYMBOL
tpLH
PARAMETER
Propagation Delay VCC=4.5V
CONDITIONS
NOTES
PIN-
NAME
MIN
3, CKIN-On 5.5
4, 7
MAX
10.0
UNIT
ns
SUB-
GROUPS
9
3, CKIN-On 7.0
4, 7
11.5 ns 10
3, CKIN-On 4.0
8.5
ns 11
4, 7
tpHL
Propagation Delay VCC=4.5V
3, CKIN-On 1.5
4, 7
10.0 ns 9
3, CKIN-On 7.0
4, 7
11.5 ns 10
3, CKIN-On 4.0
8.5
ns 11
4, 7
tosHL
Maximum Skew
Common Edge
VCC=4.5V
6 On - On
Skew
1.0
ns 9, 10,
11
tosLH
Maximum Skew
Common Edge
VCC=4.5V
6 On - On
Skew
1.0
ns 9, 10,
11
tpV
Maximum Skew
VCC=4.5V
Part/Part
6 Maximum
Skew
4.0
ns 9, 10,
11
tost
Maximum Skew
Opposite Edge
VCC=4.5V
6 Maximum
Skew
1.5
ns 9, 10,
11
tR/tF
Maximum Rise/Fall VCC=4.5V
Time
6
3.0
ns 9
6
4.0
ns 10, 11
Fmax
Maximum Clock
Frequency
VCC=4.5V
6 CP
80
6 CP
75
Mhz 9
Mhz 10, 11
Note 1: SCREEN TESTED 100% ON EACH DEVICE AT +25C & +125C TEMPERATURE, SUBGROUPS 1, 2, 7 & 8.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C & +125C TEMPERATURE,
SUBGROUPS A1, 2, 7 & 8.
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMPERATURE ONLY, SUBGROUP A9.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C & +125C TEMPERATURE,
SUBGROUPS A9 & 10.
TRANSMISSION LINE DRIVING TEST, GUARDBANDED LIMITS SET FOR +25C, 2 MSEC DURATION
MAX.
DESIGN CHARACTERIZATION DATA.
+25C & +125C MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MINIMUM LIMITS.
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