LMH6584 Datasheet, PDF(5/20 Page) National Semiconductor (TI) – 32x16 400 MHz Analog Crosspoint Switches, Gain of 1, Gain of 2

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LMH6584 Datasheet, PDF (5/20 Pages) National Semiconductor (TI) – 32x16 400 MHz Analog Crosspoint Switches, Gain of 1, Gain of 2

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Symbol

Parameter

Setup Time

Hold Time

Conditions

Min

(Note 8)

Typ

(Note 7)

Max

(Note 8)

Units

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but specific performance is not guaranteed. For guaranteed specifications, see the Electrical Characteristics tables.

Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC)

Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

Note 3: The maximum output current (IOUT) is determined by device power dissipation limitations.

Note 4: The maximum power dissipation is a function of TJ(MAX)and Î¸JA. The maximum allowable power dissipation at any ambient temperature is

PD = (TJ(MAX) â TA)/ Î¸JA. All numbers apply for packages soldered directly onto a PC Board.

Note 5: Electrical Table values apply only for factory testing conditions at the temperature indicated. No guarantee of parametric performance is indicated in the

electrical tables under conditions different than those tested.

Note 6: Slew Rate is the average of the rising and falling edges.

Note 7: Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will

also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.

Note 8: Room Temperature limits are 100% production tested at 25Â°C. Device self heating results in TJ â¥ TA, however, test time is insufficient for TJto reach

steady state conditions. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control (SQC) methods.

Note 9: Negative input current implies current flowing out of the device.

Note 10: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.

Note 11: This parameter is guaranteed by design and/or characterization and is not tested in production.

Ordering Information

Package

144-Pin LQFP

Part Number

LMH6584VV

LMH6585VV

Package Marking

LMH6584VV

LMH6585VV

Transport Media

60 Units/Tray

NSC Drawing

VNG144C

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