54AC574 Datasheet, PDF (5/10 Pages) National Semiconductor (TI) – Octal D-Type Flip-Flop with TRI-STATE Outputs

DC Characteristics for ’AC Family Devices (Continued)
Symbol
Parameter
V_CC
(V)
I_OLD
I_OHD
I_CC
(Note 3) Minimum
5.5
Dynamic Output
Current
5.5
Maximum Quiescent
5.5
Supply Current
54AC
T_A =
−55˚C to +125˚C
Guaranteed Limits
50
−50
80.0
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
DC Characteristics for ’ACT Family Devices
Symbol
Parameter
V_IH
Minimum High
Level Input
Voltage
V_IL
Maximum Low
Level Input
Voltage
V_OH
Minimum High
Level
54ACT
V_CC
T_A =
(V)
−55˚C to +125˚C
Guaranteed Limits
4.5
2.0
5.5
2.0
4.5
0.8
5.5
0.8
4.5
4.4
5.5
5.4
Units
mA
mA
µA
Units
V
V
V
4.5
3.70
V
5.5
4.70
V_OL
Maximum Low
4.5
0.1
V
Level Output
5.5
0.1
Voltage
4.5
0.50
V
5.5
0.50
I_IN
Maximum Input
5.5
±1.0
µA
Leakage Current
I_OZ
Maximum
5.5
±5.0
µA
TRI-STATE
Leakage Current
I_CCT
Maximum I_CC/Input
5.5
1.6
mA
I_OLD
(Note 5) Minimum
5.5
50
mA
Dynamic Output
I_OHD
Current
5.5
−50
mA
I_CC
Maximum Quiescent
5.5
80.0
µA
Supply Current
Note 4: All outputs loaded; thresholds on input associated with output under test.
Note 5: Maximum test duration 2.0 ms, one output loaded at a time.
Conditions
V_OLD = 1.65V
V_OHD = 3.85V
V_IN = V_CC
or GND
Conditions
V_OUT = 0.1V
or V_CC − 0.1V
V_OUT = 0.1V
or V_CC − 0.1V
I_OUT = −50 µA
(Note 4)
V_IN = V_IL or V_IH
I_OH
−24 mA
−24 mA
I_OUT = 50 µA
(Note 4)
V_IN = V_IL or V_IH
I_OL
24 mA
24 mA
V_I = V_CC, GND
V_I = V_IL, V_IH
V_O = V_CC, GND
V_I = V_CC − 2.1V
V_OLD = 1.65V
V_OHD = 3.85V
V_IN = V_CC
or GND
5
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