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| CD4511BM Datasheet, PDF (4/8 Pages) National Semiconductor (TI) – BCD-to-7 Segment Latch/Decoder/Driver | |||
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AC Electrical Characteristics
TA e 25 C and CL e 50 pF typical temperature coefficient for all values of VDD e 0 3% C
Symbol
Parameter
Conditions
CD4511BX
Min
Typ
CIN
Input Capacitance
VIN e 0
50
tr
Output Rise Time
VDD e 5V
40
(Figure 1a)
VDD e 10V
30
VDD e 15V
25
tf
Output Fall Time
VDD e 5V
125
(Figure 1a)
VDD e 10V
75
VDD e 15V
65
tPLH
Turn-Off Delay Time
VDD e 5V
640
(Data) (Figure 1a)
VDD e 10V
250
VDD e 15V
175
tPHL
Turn-On Delay Time
VDD e 5V
720
(Data) (Figure 1a)
VDD e 10V
290
VDD e 15V
195
tPLH
Turn-Off Delay Time
VDD e 5V
320
(Blank) (Figure 1a)
VDD e 10V
130
VDD e 15V
100
tPHL
Turn-On Delay Time
VDD e 5V
485
(Blank) (Figure 1a)
VDD e 10V
200
VDD e 15V
160
tPLH
Turn-Off Delay Time
VDD e 5V
313
(Lamp Test) (Figure 1a)
VDD e 10V
125
VDD e 15V
90
tPHL
Turn-On Delay Time
VDD e 5V
313
(Lamp Test) (Figure 1a)
VDD e 10V
125
VDD e 15V
90
tSETUP
Setup Time
(Figure 1b)
VDD e 5V
180
90
VDD e 10V
76
38
VDD e 15V
40
20
tHOLD
Hold Time
(Figure 1b)
VDD e 5V
0
b90
VDD e 10V
0
b38
VDD e 15V
0
b20
PWLE
Minimum Latch Enable
VDD e 5V
520
260
Pulse Width (Figure 1c)
VDD e 10V
220
110
VDD e 15V
130
65
AC Parameters are guaranteed by DC correlated testing
Max
75
80
60
50
250
150
130
1280
500
350
1440
580
400
640
260
200
970
400
320
625
250
180
625
250
180
Units
pF
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
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